Imaging by EPMA and SEM are done by accumulating and displaying positionally-related signal intensities – essentially signal intensity maps of a sample surface. The detected signals include any signal generated by electron beam – specimen interactions and, in this facility, those signals include secondary electrons, backscattered electrons, characteristic X-rays, and light (cathodoluminescence). Examples are shown in the first sidebar.
Characteristic X-ray mapping (compositional mapping)
X-ray maps represent relative elemental concentration between and within phases, and arise from emission of charateristic X-rays during inner shell ionization and subsequent relaxation in target atoms during electron bombardment.
The characteristic X-rays can be selected by either wavelength dispersive spectrometry (WDS, the essence of EPMA), or by lower spectral resolution energy dispersive spectrometry (EDS). X-ray intensities are collected and displayed pixel by pixel, and are qualitative until all elements within the material of interest have been mapped, and pixel intensities are converted to concentration after background subtraction, dead-time correction, and matrix (ZAF) correction. Typically maps are utilized as a qualitative guide. Here is an example…
Backscattered Electron Imaging
Backscattered electron imaging originates from beam electrons being elastically scattered in interactions with the strong core field near nuclei in the target material. Often referred to as phase contrast imaging, the signal essentially represents average atomic number as the backscatter efficiency increases with Z. This signal is useful in basic navigation in multi-phase materials. Here are a few examples…
Secondary Electron Imaging
Secondary electrons are very low energy electrons emitted from the target during exposure to an energetic electron beam. Generally conduction band electrons emitted at a few eV, they are eminate from the outermost few angstroms of the surface, resulting in a detailed, high resolution representation of the surface morphology of a sample. Here are a few examples…
Cathodoluminescence Imaging
Cathodoluminescence originates from inelastic scattering, electron-hole pair production, and recombination that results in the emission of a photon.
Cathodoluminescence emission wavelengths can result from impurites, crystal dislocations and other defects, in many cases revealing internal mineral structures not seen by any other method. Generations of zircon growth are often revealed by CL, which is now a fundamental characterization tool in geochronology (see images above).